1970-2014: From Space Ion Thrusters to Nano-Tools
نویسنده
چکیده
In the 1970’s, Albert Crewe demonstrated with scanning transmission electron microscopy that field emission sources allowed spectacular improvement (i.e., atomic resolution) in the field of electron microscopy [1]. Several groups in the USA, Great Britain, and France began to work on point ion sources in order to bring similar improvements to ion instruments, especially to secondary ion mass spectroscopy (SIMS).
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تاریخ انتشار 2014